Photoelectron signal simulation from textured overlayer samples

Surface and Interface Analysis

Volumn 30, Issue 1, 2000, Pages 552-556

  Vutova, K ^a   Mladenov, G ^a   Tanaka, T ^b   Kawabata, K ^b  

^a INSTITUTE OF ELECTRONICS   (Bulgaria)

^b HIROSHIMA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; SURFACE ROUGHNESS; TEXTURES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGULAR INTENSITY DISTRIBUTION; PHOTOELECTRON SIGNALS; SHADOWING EFFECTS; TEXTURED OVERLAYERS;

SURFACE STRUCTURE;

EID: 0034245323     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200008)30:1<552::AID-SIA756>3.0.CO;2-5     Document Type: Article

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