Extraction of oxide trap properties using temperature dependence of random telegraph signals in submicron metal-oxide-semiconductor field-effect transistors

Journal of Applied Physics

Volumn 89, Issue 10, 2001, Pages 5526-5532

  Amarasinghe, Nuditha Vibhavie ^a   Çelik Butler, Zeynep ^a   Keshavarz, Abdol ^b  

^a Southern Methodist University   (United States)

^b STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035873395     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1367404     Document Type: Article

References (23)

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