Characterization of nanopipes/dislocations in silicon carbide using ballistic electron emission microscopy

Journal of Applied Physics

Volumn 89, Issue 10, 2001, Pages 5797-5799

  Reddy, C V ^a   Narayanamurti, V ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035873215     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1365938     Document Type: Article

References (12)

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