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Journal of Physics D: Applied Physics

Volumn 34, Issue 15, 2001, Pages 2363-2368

Optimized polychromatic x-ray imaging with asymmetrically cut bent crystals

(4) Podorov, S G a Renner, O b Wehrhan, O a Forster E a

a FRIEDRICH SCHILLER UNIVERSITY JENA (Germany)

b INSTITUTE OF MATHEMATICS (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; IMAGING TECHNIQUES; OPTIMIZATION; TWO DIMENSIONAL; X RAY ANALYSIS;

ASYMMETRIC CUT BENT CRYSTAL; BRAGG GEOMETRY; POLYCHROMATIC X RAY IMAGING;

CRYSTALS;

EID: 0035822562 PISSN: 00223727 EISSN: None Source Type: Journal
DOI: 10.1088/0022-3727/34/15/317 Document Type: Article

Times cited : (23)

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