Bragg-Fresnel optics for hard x-ray microscopy: Development of fabrication process and x-ray characterization at the Advanced Photon Source

Review of Scientific Instruments

Volumn 69, Issue 8, 1998, Pages 2844-2848

  Li, Youli ^a   Wong, Gerard C L ^a   Safinya, Cyrus R ^a   Caine, Ernie ^a   Hu, Evelyn L ^a   Haeffner, Dean ^b   Fernandez, Patricia ^b   Yun, Wenbing ^b  

^a University of California   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001585701     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149022     Document Type: Article

References (11)

1. V. V. Aristov, Y. A. Basov, and A. A. Snigirev, Rev. Sci. Instrum. 60, 1517 (1989).
2. V. V. Aristov, Y. A. Basov, A. A. Snigirev, V. A. Yunkin, T. Ishikawa, and S. Kikuta, Nucl. Instrum. Methods Phys. Res. A 308, 413 (1991).
3. A. Snigirev, I. Snigireva, P. Bosecke, S. Lequien, and I. Schelokov, Opt. Commun. 135, 378 (1997).
4. Y. Hartman, V. Kohn, S. Kuznetsov, A. Snigirev, and I. Snigireva, Nuovo Cimento B 19, 571 (1997).
5. A. Firsov, A. Svintsov, A. Firsova, P. Chevallier, and P. Populus, Nucl. Instrum. Methods Phys. Res. A 399, 152 (1997).
6. A. Erko, Y. Agafonov, L. A. Panchenko, A. Yakshin, P. Chevallier, P. Dhez, and F. Legrand, Opt. Commun. 106, 146 (1994).
7. E. J. Caine, S. Shi, E. L. Hu, Y. Li, S. H. J. Idziak, G. Subramanian, and C. R. Safinya, Microelectron. Eng. 35, 289 (1997).
8. Y. Hartman, A. K. Freund, I. Snigireva, A. Souvorov, and A. Snigirev, Nucl. Instrum. Methods Phys. Res. A 385, 371 (1997).
9. A. G. Michette, Optical Systems for Soft X Rays (Plenum, New York, 1986).
10. U. Bonse, C. Riekel, and A. A. Snigirev, Rev. Sci. Instrum. 63, 622 (1992).
11. P. Dhez, A. Erko, E. Khzmalian, B. Vidal, and V. Zinenko, Appl. Opt. 31, 6662 (1992).