Resolution function for two-axis specular neutron reflectivity

Journal of Applied Crystallography

Volumn 29, Issue 2, 1996, Pages 152-158

  Bouwman, Wim G ^a   Pedersen, Jan Skov ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001469980     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889895012751     Document Type: Article

References (14)

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