Ferroelectric thin films of bismuth-containing layered perovskites: Part II, PbBi2Nb2O9

Journal of the American Ceramic Society

Volumn 81, Issue 12, 1998, Pages 3260-3264

  Du, Xiaofeng ^a   Chen, I Wei ^a,b  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRYSTALLIZATION; DECOMPOSITION; ELECTRIC PROPERTIES; FATIGUE OF MATERIALS; FILM PREPARATION; HEAT TREATMENT; INTERFACIAL ENERGY; NUCLEATION; PHASE COMPOSITION; THICKNESS MEASUREMENT; THIN FILMS;

LAYERED PEROVSKITE; METALORGANIC DECOMPOSITION;

FERROELECTRIC MATERIALS;

EID: 0032290854     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1998.tb02765.x     Document Type: Article

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