Radiation-enhanced network formation in copolymer galvanoforms for diffractive nickel x-ray optics with high aspect ratios

Applied Physics Letters

Volumn 72, Issue 15, 1998, Pages 1805-1807

  Weiss, D ^a   Peuker, M ^a   Schneider, G ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; COPOLYMERS; CROSSLINKING; ELECTRODEPOSITION; ELECTRON DIFFRACTION; NANOSTRUCTURED MATERIALS; NICKEL; POLYMETHYL METHACRYLATES; RADIATION EFFECTS; X RAY MICROSCOPES;

COPOLYMER GALVANOFORMS; DIFFRACTIVE NICKEL X RAY OPTICS; FIRST ORDER DIFFRACTION EFFICIENCY; MICRO ZONE PLATES; RADIATION ENHANCED NETWORK FORMATION;

OPTICS;

EID: 0032050159     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121190     Document Type: Article

References (10)

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