Using yielded cost as a metric for modeling manufacturing processes

Proceedings of the ASME Design Engineering Technical Conference

Volumn 3, Issue , 2001, Pages 67-74

  Becker, Daniel V ^a   Sandborn, Peter ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Cost; Design to cost; Yield; Yielded cost

Indexed keywords

ASSEMBLY; COMPUTER AIDED DESIGN; COST EFFECTIVENESS; DEFECTS; MICROWAVES; PROCESS ENGINEERING; PRODUCT DESIGN; PRODUCTIVITY; MANUFACTURE;

DEFECTIVE PRODUCTS; DESIGN TO COST; MICROWAVE MODULE MANUFACTURING; NON DEFECTIVE ASSEMBLY; YIELDED COST;

COMPUTER AIDED MANUFACTURING; COST ENGINEERING;

ASSEMBLY PROCESS; COMPLEX ASSEMBLY; COMPLEX PROCESSES; COST FORMULATION; DEFECTIVE PRODUCTS; MANUFACTURING PROCESS; MICROWAVE MODULES; SEQUENTIAL PROCESS;

EID: 0035791143     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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