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Volumn , Issue , 2001, Pages 250-256

Plasma deposited cf polymer films as ultra low k intermetal dielectric, film properties and application

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; AMORPHOUS MATERIALS; CHEMICAL MECHANICAL POLISHING; CROSSTALK; CURRENT DENSITY; DIELECTRIC MATERIALS; HEAT TREATMENT; OPTICAL PROPERTIES; PERMITTIVITY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; REACTIVE ION ETCHING; VACUUM APPLICATIONS;

EID: 0035790768     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (17)
  • 4
    • 0004245602 scopus 로고    scopus 로고
    • Semiconductor Industry Association
    • International Technology Roadmap for Semiconductors, Semiconductor Industry Association, 2000 updates see: http://public.itrs.net 3) Yoshinori Matsumoto, M. Ishida: Sensors and Actuators 83 (2000) p.183.
    • (2000) International Technology Roadmap for Semiconductors
  • 5
    • 0000076272 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors, Semiconductor Industry Association, 2000 updates see: http://public.itrs.net 3) Yoshinori Matsumoto, M. Ishida: Sensors and Actuators 83 (2000) p.183.
    • (2000) Sensors and Actuators , vol.83 , pp. 183
    • Matsumoto, Y.1    Ishida, M.2
  • 15
    • 0013243817 scopus 로고    scopus 로고
    • Private communication
    • U. Schubert: Private communication.
    • Schubert, U.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.