A comparison of the near field and far field emissions of a Pentium® clock IC

IEEE International Symposium on Electromagnetic Compatibility

Volumn 1, Issue , 2001, Pages 547-551

  Slattery, Kevin P ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; ELECTRIC FIELDS; ELECTRONIC EQUIPMENT TESTING; INTEGRATED CIRCUITS; MAGNETIC FIELDS; SCANNING; SIGNAL INTERFERENCE;

FAR FIELD EMISSION;

TIMING CIRCUITS;

EID: 0035785452     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Measuring the Radiated Emissions from a Family of Microprocessors Using a 1 GHz TEM Cell, K. Slattery, J. Muccioli, T. North, May 1999 IEEE Transactions on EMC
2. Measuring the Electric and Magnetic Near fields in VLSI Devices, K. Slattery, W. Cui, 1999 IEEE EMC Symposium, Seattle.
3. Constructing the Lagrangian of VLSI devices from Near Field Measurements of the Electric and Magnetic Fields, 2000 IEEE EMC Symposium, Washington D.C.
4. A Comparison of Package Types for VLSI Devices and the Impact on Radiated Emissions, K. Slattery, 1999 Automotive Electronics Council Conference, Novi, Michigan