Constructing the Lagrangian of VLSI devices from near field measurements of the electric and magnetic fields

IEEE International Symposium on Electromagnetic Compatibility

Volumn 1, Issue , 2000, Pages 129-134

  Slattery, Kevin P ^a   Muccioli, James P ^a   North, Terry M ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTROMAGNETIC COMPATIBILITY; LAGRANGE MULTIPLIERS; MAGNETIC FIELDS; MATHEMATICAL MODELS;

NEAR FIELD MEASUREMENTS;

VLSI CIRCUITS;

EID: 0033695897     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)