Measuring the radiated emissions from a family of microprocessors using a 1-GHz TEM cell

IEEE Transactions on Electromagnetic Compatibility

Volumn 41, Issue 2, 1999, Pages 146-152

  Slattery, Kevin P ^a   Muccioli, James P ^b   North, Terry ^b  

^a Recardo North America Inc   (United States)

^b CENTRO RICERCHE FIAT   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELD MEASUREMENT; ELECTROMAGNETIC WAVE EMISSION; MULTICHIP MODULES; SILICON WAFERS;

DEVICE UNDER TESTS (DUT);

MICROPROCESSOR CHIPS;

EID: 0032631832     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/15.765105     Document Type: Article

References (3)

1. J. Muccioli, T. North, and K. Slattery, "Investigation of the theoretical basis for using a 1 GHz TEM cell to evaluate the radiated emissions from integrated circuits," presented at IEEE Int. Symp. Electromagn. Compat., Santa Clara, CA, Aug. 1996.
2. A. Engel, "Model of IC emissions into a TEM cell," presented at IEEE Int. Symp. Electromagn. Compat., Austin, TX, Aug. 1997.
3. T. DiBene and J. Knighten, "Effects of device variations on the EMI potential of high speed digital integrated circuits," presented at IEEE Int. Symp. Electromagn. Compat., Austin, TX, Aug. 1997.