PSF measurement of imaging detectors with an X-ray microbeam

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4499, Issue , 2001, Pages 126-133

  Takano, Hidekazu ^a   Suzuki, Yoshio ^a   Uesugi, Kentaro ^a   Takeuchi, Akihisa ^a   Yagi, Naoto ^a  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

FZP; Point spread function; SPring 8; X ray imaging detector; X ray microbeam

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRON BEAM LITHOGRAPHY; ELECTRONS; FOCUSING; IMAGE SENSORS; IMAGING TECHNIQUES; MAGNETIC LENSES; OPTICAL VARIABLES MEASUREMENT; X RAY CAMERAS; X RAY OPTICS;

BENDING MAGNET BEAMLINE; ELECTROMAGNETIC LENS; FRESNEL ZONE PLATE; UNDULATOR BEAMLINE; X RAY ELECTRON CONVERSION; X RAY IMAGING DETECTOR; X RAY MICROBEAM;

OPTICAL TRANSFER FUNCTION;

EID: 0035766176     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.450230     Document Type: Article

References (8)

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