A critical evaluation of test patterns for EO system performance characterization

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4372, Issue , 2001, Pages 27-38

  Bijl, Piet ^a   Valeton, J Mathieu ^a   Hogervorst, Maarten A ^a  

^a TNO   (Netherlands)

Author keywords

Dynamic MRT; Electro Optical system performance testing; MRTD; MTDP; TOD

Indexed keywords

CAMERAS; IMAGE SENSORS; LINEAR SYSTEMS; PERFORMANCE; PROJECTION SYSTEMS; REAL TIME SYSTEMS;

INFRARED FOCAL PLANE ARRAY CAMERAS (IRFPA);

INFRARED IMAGING;

EID: 0035758481     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.439158     Document Type: Conference Paper

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