Bias-free procedure for the measurement of the minimum resolvable temperature difference and minimum resolvable contrast

Optical Engineering

Volumn 38, Issue 10, 1999, Pages 1735-1742

  Biji, Piet ^a   Valeton, J Mathieu ^a  

^a TNO   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; DATA ACQUISITION; IMAGING SYSTEMS; OPTICAL SENSORS; PERFORMANCE; SPATIAL VARIABLES MEASUREMENT; TEMPERATURE MEASUREMENT; VIDEO CAMERAS;

FIVE BAR REFERENCE PATTERN; FOUR BAR PATTERN; MINIMUM RESOLVABLE CONTRAST; MINIMUM RESOLVABLE TEMPERATURE DIFFERENCE; NYQUIST FREQUENCY; TRIANGLE ORIENTATION DISCRIMINATION THRESHOLD; TWO ALTERNATIVE FORCED CHOICE;

ELECTROOPTICAL DEVICES;

EID: 0033317398     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.602226     Document Type: Article

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