TOD predicts target acquisition performance for staring and scanning thermal imagers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4030, Issue , 2000, Pages 96-103

  Bijl, Piet ^a   Valeton, J Mathieu ^a   de Jong, Arie N ^a  

^a TNO   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE SENSORS; INFRARED IMAGING; OBJECT RECOGNITION; SCANNING; STANDARDS;

MINIMUM RESOLVABLE TEMPERATURE DIFFERENCE (MRTD) METHOD; PERFORMANCE METRICS; TRIANGLE ORIENTATION DISCRIMINATION (TOD) METHOD;

IMAGING SYSTEMS;

EID: 0033684658     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)