Capturing the sampling effects: A TOD sensor performance model

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4372, Issue , 2001, Pages 62-73

  Hogervorst, Maarten A ^a   Bijl, Piet ^a   Valeton, J Mathieu ^a  

^a TNO   (Netherlands)

Author keywords

Detection; Electro optical system performance testing; Infrared; Recognition; TOD methodology; Visual performance

Indexed keywords

BANDPASS FILTERS; CAMERAS; COMPUTER SIMULATION; ELECTROOPTICAL DEVICES; FOURIER OPTICS; IMAGE SENSORS; LINEAR SYSTEMS; SAMPLING;

TRIANGLE ORIENTATION DISCRIMINATION (TOD);

INFRARED IMAGING;

EID: 0035758850     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.439162     Document Type: Conference Paper

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