Strain and compositional analysis of InGaN/GaN layers

Materials Research Society Symposium - Proceedings

Volumn 639, Issue , 2001, Pages

  Pereira, Sérgio ^a   Correia, Maria R ^a   Pereira, Estela ^a   Trager Cowan, C ^a   Sweeney, F ^a   Edwards, P R ^a   O'Donnell, K P ^a   Alves, E ^a   Sequeira, A D ^a   Franco, N ^a  

^a UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; COMPOSITION; HETEROJUNCTIONS; INDIUM; LATTICE CONSTANTS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STRAIN; X RAY DIFFRACTION ANALYSIS;

DEPTH RESOLVED CATHODOLUMINESCENCE; HOOKE EQUATION; WURTZITE;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0035742089     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)