메뉴 건너뛰기




Volumn 48, Issue 6 I, 2001, Pages 1807-1814

A comparison of charge transfer efficiency measurement techniques on proton damaged n-channel CCDs for the hubble space telescope wide-field camera 3

Author keywords

CTE; CTE noise; EEPR; EEV; FPR; Minichannel; Proton radiation damage; Radiation testing; SBC; Scientific CCD; WFC3

Indexed keywords

CHARGE TRANSFER; DOSIMETRY; ELECTRIC CURRENTS; ELECTRON TRAPS; IMAGE SENSORS; PHOTONS; PROTON IRRADIATION; RADIATION DAMAGE; SPACE TELESCOPES; SPURIOUS SIGNAL NOISE; THERMAL EFFECTS; X RAY ANALYSIS;

EID: 0035722019     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.983134     Document Type: Conference Paper
Times cited : (34)

References (15)
  • 3
    • 0008618396 scopus 로고    scopus 로고
    • NASA/Goddard Space Flight Center, private communication
    • Barth, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.