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Volumn 48, Issue 6 I, 2001, Pages 1807-1814
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A comparison of charge transfer efficiency measurement techniques on proton damaged n-channel CCDs for the hubble space telescope wide-field camera 3
a
IEEE
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Author keywords
CTE; CTE noise; EEPR; EEV; FPR; Minichannel; Proton radiation damage; Radiation testing; SBC; Scientific CCD; WFC3
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Indexed keywords
CHARGE TRANSFER;
DOSIMETRY;
ELECTRIC CURRENTS;
ELECTRON TRAPS;
IMAGE SENSORS;
PHOTONS;
PROTON IRRADIATION;
RADIATION DAMAGE;
SPACE TELESCOPES;
SPURIOUS SIGNAL NOISE;
THERMAL EFFECTS;
X RAY ANALYSIS;
CHARGE TRANSFER EFFICIENCIES (CTE);
EXTENDED PIXEL EDGE RESPONSES (EPER);
FIRST PIXEL RESPONSES (FPR);
NONIONIZING ENERGY LOSSES (NIEL);
CHARGE COUPLED DEVICES;
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EID: 0035722019
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/23.983134 Document Type: Conference Paper |
Times cited : (34)
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References (15)
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