Proton-induced CCD charge transfer degradation at low-operating temperatures

IEEE Transactions on Nuclear Science

Volumn 48, Issue 6 I, 2001, Pages 1790-1795

  Hopkinson, Gordon R ^a,b  

^a IEEE   (United Kingdom)

^b Sira Electro Optics Ltd   (United Kingdom)

Author keywords

Charge transfer efficency (CTE); Charge transfer inefficency (CTI); Charge coupled device (CCD); Displacement damage; Proton

Indexed keywords

CHARGE TRANSFER INEFFICIENCIES (CTI);

CHARGE TRANSFER; DATA REDUCTION; ELECTRON ENERGY LEVELS; HOLE TRAPS; LOW TEMPERATURE EFFECTS; PROTON IRRADIATION; SPACE TELESCOPES; SPECTROSCOPIC ANALYSIS;

CHARGE COUPLED DEVICES;

EID: 0035720410     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.983132     Document Type: Conference Paper

References (18)

1. Radiation damage effects on the CCD detector of the space telescope imaging spectrograph
2. GAIA-Unravelling the origin and evolution of our galaxy
3. Full-sky astrometric mapping explorer: An optical astrometric survey mission
4. Charge transfer efficiency in proton damaged CCD's
5. Degradation of the charge transfer efficiency of a buried channel charge coupled device due to radiation damage by a beta source
6. The effect of bulk traps in proton-irradiated EEV CCDs
7. A technique to measure trap characteristics in CCD's using X-rays
8. Proton-induced charge transfer degradation in CCD's for near-room temperature applications
9. Radiation damage to charge coupled devices in the space environment
10. Particle and x-ray damage in pn-CCDs
11. Electron and neutron radiation damage effects on a two-phase CCD
12. Radiation damage in the Chandra X-ray CCDs
13. Characterization of the radiation damage in the Chandra X-ray CCDs
14. Proton-induced changes in CTE for n-channel CCD's and the effect on star tracker performance
15. Transient and permanent effects of neutron bombardment on a commercially available n-buried channel CCD
16. Displacement damage effects in mixed particle environments for shielded spacecraft CCDs