Electron and neutron radiation damage effects on a two-phase CCD

IEEE Transactions on Nuclear Science

Volumn 47, Issue 3 PART 4, 2000, Pages 1280-1291

  Stefanov, K D ^a,b   Tsukamoto, T ^a   Miyamoto, A ^a   Sugimoto, Y ^a   Tamura, N ^a   Abe, K ^a   Nagaminc, T ^a   Aso, T ^a  

^a SAGA UNIVERSITY   (Japan)

^b HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Charge transfer efficiency; Charge coupled device (CCD); Multipinned phase; Radiation damage

Indexed keywords

CHARGE COUPLED DEVICES; COLLIDING BEAM ACCELERATORS; ELECTRON IRRADIATION; ELECTRON TUNNELING; IMPACT IONIZATION; INTERFACES (MATERIALS); LINEAR ACCELERATORS; NEUTRON IRRADIATION; SILICA; SILICON;

CHARGE TRANSFER EFFICIENCY; MULTIPINNED PHASE;

RADIATION DAMAGE;

EID: 0034207393     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.856466     Document Type: Article

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