The use of atomic force microscopy to determine the sequence of crossed lines

Problems of Forensic Sciences

Volumn 46, Issue , 2001, Pages 401-412

  Khanmy Vital, Aita ^a   Kasas, Sandor ^a   Dietler, Giovanni ^a  

^a UNIVERSITY OF LAUSANNE   (Switzerland)

Author keywords

AFM; Atomic force microscopy; Document examination; Ink; Intersection; Line crossing; Paper; SEM

Indexed keywords

INK;

ACCURACY; ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; DOCUMENTATION; ELECTRON MICROSCOPY; EXAMINATION; FORENSIC SCIENCE; INTERMETHOD COMPARISON; RELIABILITY; SCANNING PROBE MICROSCOPY;

EID: 0035718729     PISSN: 12307483     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (11)

1. Atomic force microscope
2. Examination of line crossings by low KV scanning electron microscopy (SEM) using photographic stereoscopic pairs
3. Force-distance curves by atomic force microscopy
4. Experimental and theoretical aspects of the modern nanotribology
5. Classification of scanning probe microscopies
6. Sequencing of intersecting lines by combined lifting process and scanning electron miscroscopy
7. Scanning probe microscopy
8. The determination of sequence of crossing strokes by the Kromekote Paper Lifting Process and by the Scanning Electron Miscroscopic Method
9. Establishing the sequence of strokes: The state of the art
10. Use of low voltage SEM in the detection of forgeries
11. Examination of line crossings by scanning electron microscopy