Examination of line crossings by low KV scanning electron microscopy (SEM) using photographic stereoscopic pairs

Journal of Forensic Sciences

Volumn 41, Issue 1, 1996, Pages 80-85

  Blueschke, Arnold ^a,c   Lacis, Arvid ^b  

^a Forensic Consultants   (Canada)

^b Bacon Donaldson Consulting Engineers   (Canada)

^c NONE   (Canada)

Author keywords

forensic science; questioned documents; scanning electron microscopy

Indexed keywords

GLYCOL; INK;

ABSORPTION; AQUEOUS SOLUTION; ARTICLE; DOCUMENT EXAMINATION; ELECTRIC POTENTIAL; INSTRUMENTATION; OPTICS; PAPER; PHOTOGRAPHY; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; STEREORADIOGRAPHY;

EID: 0030033124     PISSN: 00221198     EISSN: None     Source Type: Journal    
DOI: 10.1520/jfs13899j     Document Type: Article

References (4)

1. Waeschle PA. Examination of line crossings by scanning electron microscopy. J Forensic Sci 1979;569-578.
2. Electron Microscopy and Photography. Eastman Kodak Company, 1973 publication.
3. Hitachi Scanning Electron Microscopy S-2500. Hitachi publication.
4. Chemical Technology Review No. 61. Printing Inks-Recent Developments. Andrew M. Wells, Noyes Data Corporation, 1976.