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Volumn 148, Issue 6, 2001, Pages 303-311

Simultaneous switching noise analysis and low-bounce buffer design

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER CIRCUITS; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; INTEGRATED CIRCUIT TESTING; MOSFET DEVICES; SPURIOUS SIGNAL NOISE;

EID: 0035707220     PISSN: 13502409     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cds:20010624     Document Type: Article
Times cited : (8)

References (19)
  • 19
    • 4244120621 scopus 로고    scopus 로고
    • Interconnect analysis program version 3.3
    • Technology Modeling Associates Inc., May
    • (1996)
    • Raphael1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.