Fabrication and characterization of narrow-band bragg-reflection filters in silicon-on-insulator ridge waveguides

Journal of Lightwave Technology

Volumn 19, Issue 12, 2001, Pages 1938-1942

  Murphy, Thomas Edward ^a,b,c   Hastings, Jeffrey Todd ^a,b,d   Smith, Henry I ^a,b,d  

^a IEEE   (United States)

^b OSA ^*  (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d USA   (United States)

Author keywords

Bragg scattering; Gratings; Optical planar waveguides; Ridge waveguides; Silicon on insulator (SOI) technology; Waveguide components; Waveguide filters

Indexed keywords

BRAG SCATTERING; BRAGG REFLECTION FILTERS; SILICON ON INSULATOR RIDGE WAVEGUIDES; SPECTRAL RESPONSE; WAVEGUIDE FILTERS;

FIBER BRAGG GRATINGS; OPTICAL DESIGN; OPTICAL VARIABLES MEASUREMENT; OPTICAL WAVEGUIDES; SILICON ON INSULATOR TECHNOLOGY; SPECTRUM ANALYSIS; WAVEGUIDE COMPONENTS;

OPTICAL FILTERS;

EID: 0035693509     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.971688     Document Type: Article

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