Roughness effect on thermal conductivity of thin films

Physica Status Solidi (B) Basic Research

Volumn 225, Issue 1, 2001, Pages 35-41

  Lü, Xiang ^a   Chu, Junhao ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035629070     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-3951(200105)225:1<35::AID-PSSB35>3.0.CO;2-3     Document Type: Article

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