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Volumn 10, Issue 4, 2001, Pages 532-537

Fabrication of ultrathin p++ silicon microstructures using ion implantation and boron etch-stop

Author keywords

[No Author keywords available]

Indexed keywords

BORON; COMPUTER SIMULATION; CRYSTAL MICROSTRUCTURE; FABRICATION; ION IMPLANTATION; PIEZOELECTRIC DEVICES; RAPID THERMAL ANNEALING; SEMICONDUCTING SILICON;

EID: 0035605866     PISSN: 10577157     EISSN: None     Source Type: Journal    
DOI: 10.1109/84.967376     Document Type: Article
Times cited : (17)

References (17)
  • 1
    • 84963736461 scopus 로고
    • Ethylene diaminie-pyrocatechol-water mixture shows etching anomaly in boron-doped silicon
    • (1971) J. Electrochem. Soc. , vol.118 , pp. 401-402
    • Bohg, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.