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Volumn 494, Issue 3, 2001, Pages 213-228

Electronic properties and structure of vanadia ultra-thin films grown on TiO2(1 1 0) in a water vapour ambient

Author keywords

Photoelectron diffraction measurement; Single crystal epitaxy; Surface structure, morphology, roughness, and topography; Titanium oxide; Vanadium oxide; X ray photoelectron spectroscopy

Indexed keywords

ANISOTROPY; ANNEALING; CRYSTAL STRUCTURE; ELECTRONIC PROPERTIES; FILM GROWTH; MONOLAYERS; SURFACE ROUGHNESS; TITANIUM DIOXIDE; VANADIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

EID: 0035577428     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01395-4     Document Type: Article
Times cited : (13)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.