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Volumn 494, Issue 3, 2001, Pages 213-228
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Electronic properties and structure of vanadia ultra-thin films grown on TiO2(1 1 0) in a water vapour ambient
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Author keywords
Photoelectron diffraction measurement; Single crystal epitaxy; Surface structure, morphology, roughness, and topography; Titanium oxide; Vanadium oxide; X ray photoelectron spectroscopy
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Indexed keywords
ANISOTROPY;
ANNEALING;
CRYSTAL STRUCTURE;
ELECTRONIC PROPERTIES;
FILM GROWTH;
MONOLAYERS;
SURFACE ROUGHNESS;
TITANIUM DIOXIDE;
VANADIUM COMPOUNDS;
X RAY DIFFRACTION ANALYSIS;
PHOTOELECTRON DIFFRACTION MEASUREMENT;
ULTRATHIN FILMS;
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EID: 0035577428
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(01)01395-4 Document Type: Article |
Times cited : (13)
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References (26)
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