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Volumn 670, Issue , 2001, Pages
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Silicide formation for Ni and Pd bilayers on Si(100) substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
ENTROPY;
LATTICE CONSTANTS;
NUCLEATION;
SUBSTRATES;
X RAY DIFFRACTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
SILICIDES;
SILICON WAFERS;
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EID: 0035556722
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-670-k6.10 Document Type: Conference Paper |
Times cited : (4)
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References (15)
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