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Volumn 669, Issue , 2001, Pages J4191-J4196

Modeling of boron implantation into Si with decaborane ions

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ION IMPLANTATION; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; MOS DEVICES; SEMICONDUCTING SILICON; SEMICONDUCTOR JUNCTIONS; SPUTTER DEPOSITION; SURFACE PHENOMENA; THIN FILMS;

EID: 0035556422     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: 10.1557/proc-669-j4.19     Document Type: Article
Times cited : (1)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.