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Volumn 669, Issue , 2001, Pages J4191-J4196
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Modeling of boron implantation into Si with decaborane ions
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
ION IMPLANTATION;
MATHEMATICAL MODELS;
MOLECULAR DYNAMICS;
MOS DEVICES;
SEMICONDUCTING SILICON;
SEMICONDUCTOR JUNCTIONS;
SPUTTER DEPOSITION;
SURFACE PHENOMENA;
THIN FILMS;
SURFACE ATOMS;
SEMICONDUCTING BORON;
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EID: 0035556422
PISSN: 02729172
EISSN: None
Source Type: Journal
DOI: 10.1557/proc-669-j4.19 Document Type: Article |
Times cited : (1)
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References (9)
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