Radiation hardness study of an APS CMOS particle tracker

IEEE Nuclear Science Symposium and Medical Imaging Conference

Volumn 1, Issue , 2001, Pages 100-103

  Dulinski, Wojciech ^a   Deptuch, Grzegorz ^a   Gornushkin, Yuri ^a   Jalocha, Pawel ^a   Riester, Jean Louis ^a   Winter, Marc ^a  

^a CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LEAKAGE CURRENTS; NEUTRONS; PARTICLE BEAM TRACKING; PROTONS; RADIATION DAMAGE;

MONOLITHIC ACTIVE PIXEL SENSORS; PARTICLE TRACKER; RADIATION HARDNESS;

PARTICLE DETECTORS;

EID: 0035554597     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Near 100% fill factor CMOS active pixels
2. A monolithic active pixel sensor for charged particle tracking
3. Particle tracking using CMOS monolithic active pixel sensor
4. Design and testing of monolithic active pixel sensors for charged particle tracking
5. Radiation tolerant VLSI circuits in standard submicron CMOS technologies
6. Total dose effects on CMOS active pixel sensors