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Volumn 1, Issue , 2000, Pages

Design and testing of monolithic active pixel sensors for charged particle tracking

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; MONOLITHIC INTEGRATED CIRCUITS; MOSFET DEVICES; PHOTODIODES; READOUT SYSTEMS; SENSORS; SILICON WAFERS;

EID: 0034593458     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (9)
  • 1
    • 0031249402 scopus 로고    scopus 로고
    • CMOS image sensors: Electronic camera-on-a-chip
    • October
    • E.R.Fossum, "CMOS Image Sensors: Electronic Camera-On-A-Chip", IEEE Trans. on Electron Devices, vol. 44, no. 10, October 1997, pp. 1689-1698
    • (1997) IEEE Trans. on Electron Devices , vol.44 , Issue.10 , pp. 1689-1698
    • Fossum, E.R.1
  • 2
    • 0003855811 scopus 로고
    • A new integrated pixel detector for high energy physics
    • Doctoral Thesis, Stanford Univ., USA
    • W.Snoyes, "A New Integrated Pixel Detector for High Energy Physics", Doctoral Thesis, Stanford Univ., USA 1992
    • (1992)
    • Snoyes, W.1
  • 3
    • 0004024795 scopus 로고    scopus 로고
    • Monolithic silicon pixel detectors in SOI technology
    • Doctoral Thesis, Univ. of Lintz, Austria
    • F.X.Pengg, "Monolithic Silicon Pixel Detectors in SOI Technology", Doctoral Thesis, Univ. of Lintz, Austria, 1996
    • (1996)
    • Pengg, F.X.1
  • 4
    • 0003960172 scopus 로고    scopus 로고
    • A monolithic active pixel sensor for charged particle tracking
    • preprint LEPSI-99-15 December; to be published in NIM A
    • R.Turchetta et al. "A Monolithic Active Pixel Sensor for Charged Particle Tracking...", preprint LEPSI-99-15 December 1999, to be published in NIMA
    • (1999)
    • Turchetta, R.1
  • 5
    • 0026954427 scopus 로고
    • Theoretical analysis and optimisation of CDS signal processing method for CCD image sensors
    • November
    • J.Hynecek, "Theoretical Analysis and Optimisation of CDS Signal Processing Method for CCD Image Sensors", IEEE Trans. Electron Devices, vol.39, pp. 2497-2507, November 1992
    • (1992) IEEE Trans. Electron Devices , vol.39 , pp. 2497-2507
    • Hynecek, J.1
  • 6
    • 0033311541 scopus 로고    scopus 로고
    • Radiation tolerant VLSI circuits in standard submicron CMOS technologies
    • December
    • G.Anelli et al, "Radiation Tolerant VLSI Circuits in Standard Submicron CMOS Technologies....", IEEE Trans. Nuclear Science, vol.46, pp. 1690-1696, December 1999
    • (1999) IEEE Trans. Nuclear Science , vol.46 , pp. 1690-1696
    • Anelli, G.1
  • 7
    • 0013337176 scopus 로고    scopus 로고
    • ISE-TCAD, ISE Integrated Systems Engineering AG, Zurich/CH, Software Release 6.0 User's Manual
    • ISE-TCAD, ISE Integrated Systems Engineering AG, Zurich/CH, Software Release 6.0 User's Manual
  • 8
    • 0013378567 scopus 로고    scopus 로고
    • Simulation and measurements of charge collection in monolithic active pixel sensors
    • to be published in NIM A
    • G.Deptuch et al., "Simulation and Measurements of Charge Collection in Monolithic Active Pixel Sensors", presented to the PIXEL2000 conference, to be published in NIM A
    • PIXEL2000 Conference
    • Deptuch, G.1
  • 9
    • 0013383471 scopus 로고    scopus 로고
    • Particle tracking using CMOS monolithic active pixel sensor
    • to be published in NIM A
    • G.Claus et al., "Particle Tracking Using CMOS Monolithic Active Pixel Sensor", presented to the PIXEL2000 conference, to be published in NIM A
    • PIXEL2000 Conference
    • Claus, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.