Vanadium oxide films with improved characteristics for IR microbolometric matrices

Technical Physics Letters

Volumn 27, Issue 5, 2001, Pages 378-380

  Zerov, V Yu ^a   Kulikov, Yu V ^a   Malyarov, V G ^a   Khrebtov, I A ^a   Shaganov, I I ^b   Shadrin, E B ^b  

^a VAVILOV STATE OPTICAL INSTITUTE   (Russian Federation)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035534734     PISSN: 10637850     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1376757     Document Type: Article

References (15)

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