Structural and noise characterization of VO2 films on SiO2/Si substrates

Technical Physics Letters

Volumn 23, Issue 7, 1997, Pages 520-522

  Baidakova, M V ^a   Bobyl' A V ^a   Malyarov, V G ^a   Tret'yakov V V ^a   Khrebtov, I A ^a   Shaganov, I I ^a  

^a PETER THE GREAT ST PETERSBURG POLYTECHNIC UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039329864     PISSN: 10637850     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1261815     Document Type: Article

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