Transmission electron microscopy of GaN columnar nanostructures grown by molecular beam epitaxy

Physics of the Solid State

Volumn 43, Issue 1, 2001, Pages 151-156

  Mamutin, V V ^a   Cherkashin, N A ^a   Vekshin, V A ^a   Zhmerik, V N ^a   Ivanov, S V ^a  

^a IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035530548     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1340201     Document Type: Article

References (21)

1. S. Strite and H. Morkos, J. Vac. Sci. Technol. B 10, 1237 (1992).
2. S. Nakamura, M. Senoh, and S. Nagahama, Jpn. J. Appl. Phys. 35, L74 (1996).
3. I. Akasaki, S. Sota, and H. Sakai, Electron. Lett. 32, 1105 (1996).
4. Y. Arakawa and H. Sakai, Appl. Phys. Lett. 40, 939 (1982).
5. R. Notzel, J. Temmyo, and T. Tamamura, Nature 369, 131 (1994).
6. K. Y. Cheng, K. C. Hsieh, and J. N. Baillargen, Appl. Phys. Lett. 60, 2892 (1992).
7. M. Yoshizawa, A. Kikuchi, M. Mori, et al., Jpn. J. Appl. Phys. 36 (43), L459 (1997).
8. R. S. Wagner and W. C. Ellis, Appl. Phys. Lett. 5 (4), 89 (1964).
9. V. V. Mamutin, Pis'ma Zh. Tekh. Fiz. 25 (18), 55 (1999) [Tech. Phys. Lett. 25, 741 (1999)].
10. G. Pozina, J. P. Bergman, B. Monemar, et al., Phys. Status Solidi B 216, 445 (1999).
11. S. M. Polyakov, E. N. Laverko, and V. M. Marakhonov, Kristallografiya 15 (3), 598 (1970) [Sov. Phys. Crystallogr. 15, 519 (1970)].
12. M. Koguchi, H. Kakibyashi, and M. Yazawa, Jpn. J. Appl. Phys. 31(7), 2061 (1992).
13. A. Sakai, H. Sunakawa, and A. Usui, Appl. Phys. Lett. 71, 2259 (1997).
14. V. V. Mamutin, V. N. Zhmerik, T. V. Shubina, et al., Pis'ma Zh. Tekh. Fiz. 24 (12), 30 (1998) [Tech. Phys. Lett. 24, 467 (1998)].
15. A. R. Smith, V. Ramachandran, R. M. Feenstra, et al., MRS Internet J. Nitride Semicond. Res. 3, 12 (1998).
16. E. I. Givargizov and A. A. Chernov, Kristallografiya 18 (1), 147 (1973) [Sov. Phys. Crystallogr. 18, 89 (1973)].
17. D. Byun, H.-J. Kim, C. H. Hong, et al., Phys. Status Solidi A 176, 643 (1999).
18. V. M. Kosevich and L. S. Palatnik, Electron Microscope Image of Dislocations and Stacking Faults: A Reference Manual (Nauka, Moscow, 1976).
19. Y. Xin, P. D. Brown, T. S. Cheng, et al., in Proceedings of the Royal Microscopical Society Conference on Microscopy of Semiconducting Materials, Oxford, 1997 (Inst. of Physics Publ., Bristol, 1997), p. 217.
20. X. H. Wu, L. M. Brown, D. Kapolnek, et al., J. Appl. Phys. 80 (6), 3228 (1996).
21. S.-H. Cho, X.-Q. Shen, and H. Okumura, Phys. Status Solidi A (2000) (in press).