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Volumn 81, Issue 11, 2001, Pages 1633-1647

Atomic structure and core composition of partial dislocations and dislocation fronts in β-SiC by high-resolution transmission electron microscopy

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[No Author keywords available]

Indexed keywords


EID: 0035526235     PISSN: 13642812     EISSN: None     Source Type: Journal    
DOI: 10.1080/13642810108223108     Document Type: Article
Times cited : (11)

References (34)
  • 3
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    • Institute of Physics Conference Series, Vol., Oxford, 6-10 April 1981, Bristol: Institute of Physics
    • Bourret, A., Thibault, J., and D’Anterroches, C., 1981, Microscopy of Semiconducting Materials 1981, Institute of Physics Conference Series, Vol. 60, Oxford, 6-10 April 1981 (Bristol: Institute of Physics), pp. 9-14.
    • (1981) Microscopy of Semiconducting Materials 1981 , vol.60 , pp. 9-14
    • Bourret, A.1    Thibault, J.2    D’Anterroches, C.3
  • 4
    • 85023466822 scopus 로고
    • PhD Thesis, Stuttgart University, Germany
    • Bressiani, A. H. A., 1984, PhD Thesis, Stuttgart University, Germany.
    • (1984)
    • Bressiani, A.H.A.1
  • 21
    • 0020934446 scopus 로고
    • Basta weesy, Institute of Physics Conference Series, Vol., Oxford, 21-23 March 1983, Bristol: Institute of Physics
    • Pond, R. C., Bacon, D. J., and Basta weesy. 1983, Macroscopy of Semiconducting Materials 1983, Institute of Physics Conference Series, Vol. 67, Oxford, 21-23 March 1983 (Bristol: Institute of Physics), p. 253.
    • (1983) Macroscopy of Semiconducting Materials 1983 , vol.67 , pp. 253
    • Pond, R.C.1    Bacon, D.J.2
  • 22
    • 85023589992 scopus 로고    scopus 로고
    • PhD Thesis, Université Nantes, France
    • Ragaru, C. 1997, PhD Thesis, Université Nantes, France.
    • (1997)
    • Ragaru, C.1
  • 25
    • 0020945766 scopus 로고
    • Institute of Physics Conference Series, Oxford, 21 23 March 1983 (Bristol: Institute of Physics
    • Sinclair, R., Ponce, F. A., Yamashita, T., and Smith, D. J., 1983, Microscopy of Semiconducting Materials 1983, Institute of Physics Conference Series, Vol. 67, Oxford, 21 23 March 1983 (Bristol: Institute of Physics), pp. 103-108.
    • (1983) Microscopy of Semiconducting Materials 1983 , vol.67 , pp. 103-108
    • Sinclair, R.1    Ponce, F.A.2    Yamashita, T.3    Smith, D.J.4
  • 27
    • 21544455975 scopus 로고
    • edited by C. E. H. Bawn, H. Fröhlich, P. B. Hirsch, and N. F. Mott (Oxford: Clarendon
    • Spence, J. C. H., 1981, Experimental High Resolution Electron Microscopy, edited by C. E. H. Bawn, H. Fröhlich, P. B. Hirsch, and N. F. Mott (Oxford: Clarendon), p. 154.
    • (1981) Experimental High Resolution Electron Microscopy , pp. 154
    • Spence, J.C.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.