-
8
-
-
0023997710
-
-
K. Maeda, K. Suzuki, S. Fujita, M. Ichihara, and S. Hyodo, Philos. Mag. A 57, 573-592 (1988).
-
(1988)
Philos. Mag. A
, vol.57
, pp. 573-592
-
-
Maeda, K.1
Suzuki, K.2
Fujita, S.3
Ichihara, M.4
Hyodo, S.5
-
9
-
-
3643120871
-
-
Ph.D. Thesis, Case Western Reserve University
-
J. W. Yang, Ph.D. Thesis, Case Western Reserve University (1993).
-
(1993)
-
-
Yang, J.W.1
-
10
-
-
0000513369
-
-
edited by M. H. Yoo and M. Wuttig The Minerals, Metals, and Materials Society, Warrendale, PA
-
P. Pirouz, in Twinning in Advanced Materials, edited by M. H. Yoo and M. Wuttig (The Minerals, Metals, and Materials Society, Warrendale, PA, 1994), pp. 275-295.
-
(1994)
Twinning in Advanced Materials
, pp. 275-295
-
-
Pirouz, P.1
-
11
-
-
0013225197
-
-
Paris, Colloque
-
H. Alexander, P. Haasen, R. Labusch, and W. Schröter, Foreword to J. Phys. (Paris) 40, Colloque C6 (1979).
-
(1979)
Foreword to J. Phys.
, vol.40
-
-
Alexander, H.1
Haasen, P.2
Labusch, R.3
Schröter, W.4
-
12
-
-
0026360413
-
-
Microscopy of Semiconducting Materials, edited by A. G. Cullis and N. J. Long, Bristol
-
P. Pirouz, J. W. Yang, J. A. Powell, and F. Ernst, in Microscopy of Semiconducting Materials, edited by A. G. Cullis and N. J. Long (Inst. of Phys. Conf. Ser. 117, Bristol, 1991), pp. 149-154.
-
(1991)
Inst. of Phys. Conf. Ser.
, vol.117
, pp. 149-154
-
-
Pirouz, P.1
Yang, J.W.2
Powell, J.A.3
Ernst, F.4
-
13
-
-
0000047373
-
-
P. K. Sitch, R. Jones, S. Öberg, and M. I. Heggie, Phys. Rev. B 52, 4951-4955 (1995).
-
(1995)
Phys. Rev. B
, vol.52
, pp. 4951-4955
-
-
Sitch, P.K.1
Jones, R.2
Öberg, S.3
Heggie, M.I.4
-
14
-
-
3643085438
-
-
M.Sc. Thesis, University of Oxford
-
G. Feuillet, M.Sc. Thesis, University of Oxford (1982).
-
(1982)
-
-
Feuillet, G.1
-
16
-
-
0001051062
-
-
Kyoto, edited by T. Imura, S. Marusa, and T. Suzuki (Jpn. Soc. Electron Microscopy, Tokyo, Japan)
-
D. Cherns and A. R. Preston, Proceedings of the XIth Int. Cong. on Electron Microscopy, Kyoto. 1986, edited by T. Imura, S. Marusa, and T. Suzuki (Jpn. Soc. Electron Microscopy, Tokyo, Japan), Vol. 1. p. 721.
-
(1986)
Proceedings of the XIth Int. Cong. on Electron Microscopy
, vol.1
, pp. 721
-
-
Cherns, D.1
Preston, A.R.2
-
19
-
-
85033822257
-
-
Proceedings of the 13th International Congress on Electron Microscopy, edited by B. Jouffrey and C. Colliex, Paris
-
X. J. Ning and P. Pirouz, in Proceedings of the 13th International Congress on Electron Microscopy, edited by B. Jouffrey and C. Colliex (Les Éditions de Physique 1, Paris, 1994), pp. 895-896.
-
(1994)
Les Éditions de Physique
, vol.1
, pp. 895-896
-
-
Ning, X.J.1
Pirouz, P.2
-
20
-
-
0242706502
-
-
edited by K. Yanagida and R. Newnham Ceramic Society of Japan, Tsukuba, Japan
-
J. W. Yang, X. J. Ning, and P. Pirouz, in Japan-US Workshop on Functional Fronts in Advanced Ceramics, edited by K. Yanagida and R. Newnham (Ceramic Society of Japan, Tsukuba, Japan, 1994), pp. 55-58.
-
(1994)
Japan-US Workshop on Functional Fronts in Advanced Ceramics
, pp. 55-58
-
-
Yang, J.W.1
Ning, X.J.2
Pirouz, P.3
-
21
-
-
0028317533
-
-
Defect-Interface Interactions, edited by E. P. Kvam, A. H. King, M. J. Mills, T. D. Sands, and V. Vitek, Pittsburgh, PA
-
X. J. Ning and P. Pirouz, in Defect-Interface Interactions, edited by E. P. Kvam, A. H. King, M. J. Mills, T. D. Sands, and V. Vitek (Mater. Res. Soc. Symp. Proc. 319, Pittsburgh, PA, 1994), pp. 441-456.
-
(1994)
Mater. Res. Soc. Symp. Proc.
, vol.319
, pp. 441-456
-
-
Ning, X.J.1
Pirouz, P.2
-
23
-
-
85033812745
-
-
note
-
For a screw dislocation, the equivalent convention is to assume that b is positive when it is parallel to a left-handed dislocation.
-
-
-
-
24
-
-
21544455034
-
-
J. A. Powell, J. B. Petit, J. H. Edgar, J. W. Yang, P. Pirouz, W. J. Choyke, L. Clemen, and M. Yoganathan, Appl. Phys. Lett. 59, 333-335 (1991).
-
(1991)
Appl. Phys. Lett.
, vol.59
, pp. 333-335
-
-
Powell, J.A.1
Petit, J.B.2
Edgar, J.H.3
Yang, J.W.4
Pirouz, P.5
Choyke, W.J.6
Clemen, L.7
Yoganathan, M.8
-
25
-
-
85033825485
-
-
Cree Research, Inc., Durham, N.C.
-
Cree Research, Inc., Durham, N.C.
-
-
-
-
26
-
-
85033807245
-
-
QM High-Temperature Microhardness Tester, Nikon, Inc., Tokyo, Japan
-
QM High-Temperature Microhardness Tester, Nikon, Inc., Tokyo, Japan.
-
-
-
-
27
-
-
0003710915
-
-
JEOL, Ltd., Kyoto, Japan
-
M. Tanaka, M. Terauchi, and M. Kaneyama, Convergent-Beam Electron Diffraction II (JEOL, Ltd., Kyoto, Japan, 1988).
-
(1988)
Convergent-Beam Electron Diffraction II
-
-
Tanaka, M.1
Terauchi, M.2
Kaneyama, M.3
-
30
-
-
85033830059
-
-
Microscopy of Semiconducting Materials, edited by A. G. Cullis and A. Staton-Bevan. Bristol, in press
-
P. Pirouz and X. J. Ning in Microscopy of Semiconducting Materials, edited by A. G. Cullis and A. Staton-Bevan (Inst. Phys. Conf. Ser. Bristol, 1995, in press).
-
(1995)
Inst. Phys. Conf. Ser.
-
-
Pirouz, P.1
Ning, X.J.2
-
32
-
-
0001823799
-
-
Microscopy of Semiconducting Materials, edited by A. G. Cullis and D. C. Joy, Bristol
-
P. B. Hirsch, A. Ourmazd, and P. Pirouz, in Microscopy of Semiconducting Materials, edited by A. G. Cullis and D. C. Joy (Inst. Phys. Conf. Ser. No. 60, Bristol, 1981), pp. 29-34.
-
(1981)
Inst. Phys. Conf. Ser.
, vol.60
, pp. 29-34
-
-
Hirsch, P.B.1
Ourmazd, A.2
Pirouz, P.3
-
37
-
-
0022129745
-
-
P. B. Hirsch, P. Pirouz, S. G. Roberts, and P. D. Warren, Philos. Mag. B 52, 759-784 (1985).
-
(1985)
Philos. Mag. B
, vol.52
, pp. 759-784
-
-
Hirsch, P.B.1
Pirouz, P.2
Roberts, S.G.3
Warren, P.D.4
-
39
-
-
3643118827
-
-
edited by F. R. N. Nabarro and M. S. Duesbery North-Holland Publishing Co., Amsterdam
-
K. Maeda and S. Takeuchi, in Dislocations in Solids, edited by F. R. N. Nabarro and M. S. Duesbery (North-Holland Publishing Co., Amsterdam, 1995), Vol. 10.
-
(1995)
Dislocations in Solids
, vol.10
-
-
Maeda, K.1
Takeuchi, S.2
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