UHV electron microscope and simultaneous STM observation of gold stepped surfaces

Surface Science

Volumn 415, Issue 3, 1998, Pages

  Ohnishi, Hideaki ^a   Kondo, Yukihito ^a   Takayanagi, Kunio ^a,b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Electron microscopy; Gold; Scanning tunneling microscopy; Surface topography

Indexed keywords

ELECTRON MICROSCOPY; GOLD; MICROSCOPES; SCANNING TUNNELING MICROSCOPY; SURFACE TOPOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

SPHERICAL APEX CURVATURE;

SURFACES;

EID: 0032500397     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00623-2     Document Type: Article

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