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Volumn 136-138, Issue , 1998, Pages 1086-1091

High depth resolution analysis of Cu/Si(111) "5 × 5" structure with medium energy ion scattering

Author keywords

Cu on Si(111); Medium energy ion scattering; Monte Carlo simulation; Surface structure analysis

Indexed keywords

COMPUTER SIMULATION; COPPER; ELECTRON TRANSITIONS; HETEROJUNCTIONS; IONS; MONTE CARLO METHODS; SCATTERING; SEMICONDUCTING SILICON; SURFACE STRUCTURE;

EID: 0032017530     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00897-5     Document Type: Article
Times cited : (7)

References (28)
  • 13
    • 0042412953 scopus 로고    scopus 로고
    • Proc. of symp. on advanced surface analytical technology
    • R. Shimizu (Ed.), in press
    • T. Ichinokawa et al., Proc. of Symp. on Advanced Surface Analytical Technology, in: R. Shimizu (Ed.), Jpn. Soc. Prom. Sci., in press.
    • Jpn. Soc. Prom. Sci.
    • Ichinokawa, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.