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IEEE Transactions on Electronics Packaging Manufacturing

Volumn 24, Issue 4, 2001, Pages 351-358

Manufacturer assessment procedure and criteria for parts selection and management

(3) Syrus, Toby b Pecht, Michael G a,b Uppalapati, Ramgopal c

a IEEE

b UNIVERSITY OF MARYLAND (United States)

c INTEL CORPORATION (United States)

Author keywords

Change notification; Component; Corrective and preventive actions; Electronics industry; Handling; Integrated circuits; Manufacturer assessment; Manufacturer identification; Part selection; Process capability index; Process control; Semiconductor devices; Statistical process control; Traceability

Indexed keywords

COMPONENTS; DATA ACQUISITION; DECISION MAKING; INTEGRATED CIRCUITS; MANAGEMENT; STATISTICAL PROCESS CONTROL;

PARTS SELECTION;

ELECTRON DEVICE MANUFACTURE;

EID: 0035493660 PISSN: 1521334X EISSN: None Source Type: Journal
DOI: 10.1109/6104.980045 Document Type: Article

Times cited : (10)

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