AFM characterization of PbTe quantum dots grown by molecular beam epitaxy under Volmer-Weber mode

Journal of Crystal Growth

Volumn 231, Issue 1-2, 2001, Pages 121-128

  Ferreira, S O ^a   Neves, B R A ^b   Magalhaes Paniago R ^b   Malachias, A ^b   Rappl, P H O ^c   Ueta, A Y ^c   Abramof, E ^c   Andrade, M S ^d  

^a FEDERAL UNIVERSITY OF VIÇOSA   (Brazil)

^b FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

^c INSTITUTO NACIONAL DE PESQUISAS ESPACIAIS   (Brazil)

^d FUNDAÇÃO CENTRO TECNOLÓGICO DE MINAS GERAIS   (Brazil)

Author keywords

A1. Atomic force microscopy; A1. Nanostructures; A2. Molecular beam epitaxy; B1. Tellurites; B2. Semiconducting lead compounds

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; MOLECULAR BEAM EPITAXY; MORPHOLOGY; NANOSTRUCTURED MATERIALS; SEMICONDUCTING LEAD COMPOUNDS;

STRANSKY-KRASTANOV MODE; VOLMER-WEBER GROWTH MODE;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0035452441     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)01421-X     Document Type: Article

References (19)