Hidden Markov Models with patterns to learn Boolean vector sequences and application to the built-in self-test for integrated circuits

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 23, Issue 9, 2001, Pages 997-1008

  Brehelin L ^a   Gascuel, O ^a   Caraux, G ^a  

^a UNIV MONTPELLIER   (France)

Author keywords

Boolean vector sequence modeling; Built in self test for integrated circuits; Hidden Markov models; Hybrid approach; Structure (and parameters) learning

Indexed keywords

BOOLEAN FUNCTIONS; BUILT-IN SELF TEST; INTEGRATED CIRCUIT TESTING; ITERATIVE METHODS; MARKOV PROCESSES; MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; MICROELECTRONICS; PATTERN RECOGNITION; PROBABILITY DISTRIBUTIONS; VECTORS;

BOOLEAN VECTOR SEQUENCES; HIDDEN MARKOV MODEL;

LEARNING ALGORITHMS;

EID: 0035440520     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.955112     Document Type: Article

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