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Volumn 19, Issue 5, 2001, Pages 1734-1738

Surface analysis of (NH4)2Sx-treated InGaN using x-ray photoelectron spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CONTAMINATION; SEMICONDUCTING INDIUM COMPOUNDS; SURFACE PROPERTIES; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE STATE REDUCTION;

AMMONIUM COMPOUNDS;

EID: 0035440462 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.1395618 Document Type: Article

Times cited : (28)

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