Optical roughness measurements with fringe projection

Applied Optics

Volumn 38, Issue 13, 1999, Pages 2837-2842

  Windecker, Robert ^a   Franz, Stefan ^a   Tiziani, Hans J ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CORRELATION METHODS; DIFFRACTION GRATINGS; DIFFRACTIVE OPTICS; INTERFEROMETRY; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; RAY TRACING; REGRESSION ANALYSIS; ROUGHNESS MEASUREMENT; SURFACE ROUGHNESS;

CONFOCAL MICROSCOPY; FRINGE PROJECTION TECHNIQUES; TACTILE SENSORS; WHITE-LIGHT INTERFEROMETRY;

OPTICAL SENSORS;

EID: 0032614531     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.002837     Document Type: Article

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