Observation of change in the oxidation state at ferromagnet/insulator interface upon thermal annealing

Europhysics Letters

Volumn 55, Issue 3, 2001, Pages 439-444

  Seve, L ^a   Zhu, W ^a   Sinkovic, B ^a   Freeland, J W ^b   Coulthard, I ^b   Antel Jr , W J ^b   Parkin, S S P ^c  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035413533     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2001-00433-3     Document Type: Article

References (6)

1. PARKIN S. S. P. et al., J. Appl. Phys., 85 (1999) 5828.
2. SOUSA R. C. et al., Appl. Phys. Lett., 73 (1998) 3288.
3. SATO M., KIKUCHI H. and KOBAYASHI K., J. Appl. Phys., 83 (1998) 6691.
4. SOUSA R. C. et al., J. Appl. Phys., 85 (1999) 5258.
5. CARDOSO S. et al., Appl. Phys. Lett., 76 (2000) 610.
6. ZHU W., HIRSCHMUGL C. J., LAINE A. D., SINKOVIC B. and PARKIN S. S. P., Appl. Phys. Lett., 78 (2001) 3103.