Investigation of crossed SAW fields by scanning acoustic force microscopy

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 48, Issue 4, 2001, Pages 1132-1138

  Behme, Gerd ^b   Hesjedal, Thorsten ^a,c  

^a IEEE

^b PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

^c Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC SURFACE WAVE DEVICES; ACOUSTIC WAVE PROPAGATION; ELASTICITY; LATTICE VIBRATIONS; SEMICONDUCTING GALLIUM ARSENIDE;

LOVE WAVES; RAYLEIGH WAVES; SCANNING ACOUSTIC FORCE MICROSCOPY;

ACOUSTIC MICROSCOPES;

ARTICLE;

EID: 0035384793     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/58.935732     Document Type: Article

References (14)

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8. Scanning acoustic force microscope measurements on grating-like electrodes
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10. Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope
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12. 2 structures
13. How does a tip tap?