Nanoscale determination of phase velocity by scanning acoustic force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 55, Issue 23, 1997, Pages 15852-15855

  Chilla, E ^a   Hesjedal, T ^a   Fröhlich, H J ^a  

^a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001559465     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.15852     Document Type: Article

References (24)

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24. Assuming that both IDT's contribute with 10 dBm each to the delay line losses, the amplitude is given after G.W. Farnell, Wave Electron. 2, 1 (1976) by u=4.2×(Formula presented)(W/ω(Formula presented) ((Formula presented)/W s(Formula presented), with W=(1 mW/330 μm) being the acoustic beam power per meter of aperture and ω/2π=219 MHz the SAW frequency. Nonlinear effects of wave propagation were found by W. Gibson et. al J. Appl. Phys. 45, 3288 (1974), to appear on ST-X quartz at amplitudes above 1 nm.