Diffusion-wave laser radiometric diagnostic quality-control technologies for materials NDE/NDT

NDT and E International

Volumn 34, Issue 4, 2001, Pages 277-287

  Mandelis, A ^a  

^a Department of Mechanical and Industrial Engineering   (Canada)

Author keywords

Depth profilometry; Diffusion wave technologies; Laser radiometric diagnostics; Metals; NDE NDT; Semiconductors

Indexed keywords

COATINGS; LASER APPLICATIONS; RADIOMETRY; SEMICONDUCTOR DEVICE MANUFACTURE; SILICON WAFERS; STEEL STRUCTURES; THERMAL DIFFUSION IN SOLIDS;

LASER RADIOMETRIC DIAGNOSTICS;

NONDESTRUCTIVE EXAMINATION;

EID: 0035372201     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0963-8695(00)00068-2     Document Type: Article

References (24)

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