In situ visualization of interface dynamics during the double laser recrystallization of amorphous silicon thin films

Journal of Crystal Growth

Volumn 226, Issue 1, 2001, Pages 8-12

  Lee, Minghong ^a   Moon, Seungjae ^a   Grigoropoulos, Costas P ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Directional solidification; Optical microscopy; Recrystallization; Semiconducting silicon

Indexed keywords

AMORPHOUS SILICON; CONTINUOUS WAVE LASERS; EXCIMER LASERS; GRAIN GROWTH; INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; PULSED LASER APPLICATIONS; PUMPING (LASER); RECRYSTALLIZATION (METALLURGY); SEMICONDUCTING SILICON; SOLIDIFICATION; THIN FILMS;

DIRECTIONAL SOLIDIFICATION; DOUBLE LASER RECRYSTALLIZATION METHOD;

SEMICONDUCTING FILMS;

EID: 0035370080     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)01272-6     Document Type: Article

References (8)